| 編號(hào) | 中文名稱 | 英文名稱 |
|---|
| BS 3828-1973
| 石英玻璃規(guī)范
| Specification for crystal glass
|
| BS 6711-1-1986
| 主要由玻璃、瓷料或透明石英制作的實(shí)驗(yàn)室器皿相關(guān)詞匯.第1部分:器皿項(xiàng)目名稱
| Vocabulary relating to laboratory apparatus made essentially from glass, porcelain or vitreous silica - Names for items of apparatus
|
| BS 9612 N004-1977
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、47 U/2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.寬溫范圍
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N005-1977
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.窄溫范圍(非溫控)
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode , AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level
|
| BS 9612 N006-1977
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、47U/2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, 47 U/2, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N008-1977
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼、50至125MHz頻率規(guī)范.寬溫范圍(非溫控)操作用第五諧
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N009-1977
| 經(jīng)質(zhì)量評(píng)定的振蕩器用冷焊封石英晶體振子詳細(xì)規(guī)范.DN、DQ和DP外殼,50至125MHz頻率規(guī)范.窄溫范圍(非溫控)操
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DN, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level
|
| BS 9612 N010-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DP外殼、6.0至25MHz頻率范圍.寬溫范圍(非溫控)操作的基波厚度剪切模
| Detail specification for cold welded seal quartz crystal units for oscillator applications - DK enclosure, 6.0 to 25 MHz frequency range - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N016-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.寬溫范圍(非
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N017-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、0.8至20MHz和3.0到30MHz頻率范圍.窄溫范圍(非
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 0.8 to 20 MHz and 3.0 to 30 MHz frequency ranges - Fundamental thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level
|
| BS 9612 N018-1979
| 振蕩器用電阻焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N019-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.窄溫范圍(非溫控)操作的第
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 17 to 75 MHz frequency range - Third overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level
|
| BS 9612 N020-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、17至75MHz頻率范圍.寬溫范圍(非溫控)操作的第
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over wide temperature ranges (non-temperature controlled) - Full assessment level
|
| BS 9612 N021-1979
| 振蕩器用冷焊密封石英晶體振子詳細(xì)規(guī)范.DN、D2、DQ和DP外殼、50至125MHz頻率范圍.窄溫范圍(溫控)操作的第五
| Detail specification for resistance welded seal quartz crystal units for oscillator applications - DN, DZ, DQ and DP enclosures, 50 to 125 MHz frequency range - Fifth overtone thickness-shear mode, AT-cut, for operation over narrow temperature ranges (temperature controlled) - Full assessment level
|
| BS 9617-1982
| 經(jīng)質(zhì)量評(píng)估的石英晶體振子詳細(xì)規(guī)范的制定規(guī)則.全面評(píng)估級(jí)
| Rules for the preparation of detail specifications for quartz crystal units of assessed quality - Full assessment level
|
| BS 9625-1983
| 經(jīng)質(zhì)量評(píng)定的石英晶體振蕩器空白詳細(xì)規(guī)范.全面評(píng)定級(jí)
| Blank detail specification for quartz crystal oscillators of assessed quality: full assessment level
|
| BS EN 12904-2005
| 人類生活用水處理用制品.石英砂和石英礫石
| Products used for treatment of water intended for human consumption - Silica sand and silica gravel
|
| BS EN 168100-1995
| 電子元器件質(zhì)量評(píng)定協(xié)調(diào)體系.石英晶體器件的分規(guī)范.(性能驗(yàn)收)
| Harmonized system of quality assessment for electronic components - Sectional specification: quartz crystal units (capability approval)
|
| BS EN 168101-1990
| 電子元器件質(zhì)量保證協(xié)調(diào)體系.空白詳細(xì)規(guī)范.石英晶體部件(性能認(rèn)可)
| Harmonized system of quality assessment for electronic components - Blank detail specification: quartz crystal units (capability approval)
|
| BS EN 168200-1991
| 電子元器件質(zhì)量評(píng)定協(xié)調(diào)系統(tǒng).分規(guī)范:石英晶體部件(合格鑒定批準(zhǔn))
| Harmonized system of quality assessment for electronic components - Sectional specification: quartz crystal units (qualification approval)
|
| BS EN 168201-1996
| 電子元器件的質(zhì)量評(píng)估協(xié)調(diào)體系.空白詳細(xì)規(guī)范.石英晶體元件(資格認(rèn)可)
| Harmonized system of quality assessment for electronic components - Blank detail specification - Quartz crystal units - (Qualification approval)
|
| BS EN 60122-1-2003
| 經(jīng)質(zhì)量評(píng)定的石英晶體元件.總規(guī)范
| Quartz crystal units of assessed quality - Generic specification
|
| BS EN 60122-3-2002
| 質(zhì)量評(píng)定的石英晶體元件.標(biāo)準(zhǔn)外形和引線連接器
| Quartz crystal units of assessed quality - Standard outlines and lead connections
|
| BS EN 60444-1-1997
| 石英晶體單元參數(shù)的測(cè)量.第1部分:用π型網(wǎng)絡(luò)零相位技術(shù)測(cè)量石英晶體單元諧振頻率和諧振電阻的基本方法
| Measurement of quartz crystal unit parameters - Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network
|
| BS EN 60444-2-1993
| 石英晶體元件參數(shù)的測(cè)定.第2部分:用相位偏離法測(cè)量石英晶體單元的動(dòng)態(tài)電容
| Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units
|
| BS EN 60444-3-1993
| 石英晶體器件參數(shù)的測(cè)定.第3部分:用與并聯(lián)電容量Co補(bǔ)償相連的π網(wǎng)絡(luò)相位技術(shù)測(cè)量200MHz以下的石英器件的兩
| Measurement of quartz crystal unit parameters - Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a -network with compensation of the parallel capacitance C0
|
| BS EN 60444-4-1993
| 石英晶體元件參數(shù)測(cè)量.第4部分:30MHz以下石英晶體元件負(fù)荷諧振頻率fL.負(fù)荷諧振電阻R1測(cè)量方法,以及石英晶體
| Measurement of quartz crystal unit parameters - Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
|
| BS EN 60444-5-1995
| 石英晶體元件參數(shù)測(cè)量.第5部分:用自動(dòng)網(wǎng)絡(luò)分析儀和誤差修正技術(shù)測(cè)定等效電氣參數(shù)
| Measurement of quartz crystal unit parameters - Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
|
| BS EN 60444-6-1995
| 石英晶體元件參數(shù)測(cè)量.驅(qū)動(dòng)級(jí)相關(guān)性測(cè)量
| Measurement of quartz crystal unit parameters - Measurement of drive level dependence (DLD)
|
| BS EN 60444-7-2004
| 石英晶體元件參數(shù)的測(cè)量.石英晶體元件的活性和頻率下降的測(cè)量
| Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
|
| BS EN 60444-8-2003
| 石英晶體元件參數(shù)的測(cè)量.表面安裝石英晶體元件用試驗(yàn)裝置
| Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
|
| BS EN 60444-9-2007
| 石英晶體元件參數(shù)測(cè)量.壓電晶體元件寄生振蕩測(cè)量
| Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
|
| BS EN 60455-3-2-2003
| 電氣絕緣用樹脂基反應(yīng)性復(fù)合物.單項(xiàng)材料規(guī)范.填石英的環(huán)氧樹脂復(fù)合物.第2活頁:填石英的環(huán)氧樹脂復(fù)合物
| Resin based reactive compounds used for electrical insulation - Specifications for individual materials - Quartz filled epoxy resinous compounds - Sheet 2: Quartz filled epoxy resinous compounds
|
| BS EN 60679-1-2007
| 經(jīng)質(zhì)量評(píng)定的石英晶體控制振蕩器.總規(guī)范
| Quartz crystal controlled oscillators of assessed quality - Generic specification
|
| BS EN 60679-3-2002
| 經(jīng)質(zhì)量評(píng)定的石英晶體控制振蕩器.標(biāo)準(zhǔn)外形和引線連接
| Quartz crystal controlled oscillators of assessed quality - Standard outlines and lead connections
|
| BS EN 60679-4-1-1998
| 經(jīng)質(zhì)量評(píng)估的石英晶體受控振蕩器.空白詳細(xì)規(guī)范.能力認(rèn)可
| Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Capability approval
|
| BS EN 60679-4-1998
| 經(jīng)質(zhì)量評(píng)定的石英晶體受控振蕩器.分規(guī)范.能力認(rèn)可
| Quartz crystal controlled oscillators of assessed quality - Sectional specification - Capability approval
|
| BS EN 60679-5-1-1998
| 經(jīng)質(zhì)量評(píng)估的石英晶體受控振蕩器.空白詳細(xì)規(guī)范.合格鑒定
| Quartz crystal controlled oscillators of assessed quality - Blank detail specification - Qualification approval
|
| BS EN 60679-5-1998
| 經(jīng)質(zhì)量評(píng)估的石英晶體受控振蕩器.分規(guī)范.合格鑒定
| Quartz crystal controlled oscillators of assessed quality - Sectional specification - Qualification approval
|
| BS EN 60682-1994
| 石英鹵鎢燈燈夾溫度測(cè)量方法
| Method for measuring the pinch temperature of quartz-tungsten-halogen lamps
|
| BS EN 60758-2005
| 人造石英晶體.規(guī)范和使用指南
| Synthetic quartz crystal - Specifications and guide to the use
|
| BS EN ISO 10650-1-2005
| 牙科學(xué).動(dòng)力聚合活化劑.石英鎢鹵素?zé)? | Dentistry - Powered polymerization activators - Quartz tungsten halogen lamps
|
| BS EN ISO 3262-13-1998
| 涂料填充劑.規(guī)范和試驗(yàn)方法.天然石英(地)
| Extenders for paints - Specifications and methods of test - Natural quartz (ground)
|
| BS EN ISO 3262-15-2000
| 涂料填充劑.規(guī)范和試驗(yàn)方法.透明石英
| Extenders for paints - Specifications and methods of test - Vitreous silica
|
| BS EN ISO 3262-19-2000
| 涂料填充劑.規(guī)范和試驗(yàn)方法.沉淀石英砂
| Extenders for paints - Specifications and methods of test - Precipitated silica
|
| BS EN ISO 3262-20-2000
| 涂料填充劑.規(guī)范和試驗(yàn)方法.煙化石英砂
| Extenders for paints - Specifications and methods of test - Fumed silica
|
| BS EN ISO 3262-21-2000
| 涂料填充劑.規(guī)范和試驗(yàn)方法.石英砂(未磨碎天然石英)
| Extenders for paints - Specifications and methods of test - Silica sand (unground natural quartz)
|
| BS ISO 10553-2003
| 鐘表學(xué).石英表準(zhǔn)確度評(píng)價(jià)規(guī)程
| Horology - Procedure for evaluating the accuracy of quartz watches
|
| 編號(hào) | 中文名稱 | 英文名稱 |
|---|